The sources of electron-induced contamination in kinetic vacuum systems
- 1 January 1954
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 5 (1) , 27-31
- https://doi.org/10.1088/0508-3443/5/1/307
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- The origin of specimen contamination in the electron microscopeBritish Journal of Applied Physics, 1953
- Application of the mass spectrometer to high vacuum problemsJournal of Scientific Instruments, 1951