Interference thickness oscillations of an X-ray wave on periodically profiled silicon
- 16 August 1988
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 108 (2) , 651-655
- https://doi.org/10.1002/pssa.2211080222
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Observation of X-ray bragg diffraction on the periodic surface relief of a perfect silicon crystalOptics Communications, 1986
- Experimental investigation of X-ray Bragg diffraction on the periodic surface relief of a perfect crystalPhysica Status Solidi (a), 1986