Copper phthalocyanine-titanium oxide multilayers

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Abstract
Copper phthalocyanine‐titanium oxide (CuPc‐TiOx) heteromultilayers have been fabricated by evaporation and reactive evaporation techniques, and their structural and optoelectronic properties investigated. X‐ray diffraction and secondary ion mass spectroscopy confirm the formation of a clear alternating layered structure on a nanometer scale. An interface roughness of 7 Å has been achieved for a multilayer with an artificial period of 40 Å. Atomic force microscopy at scratched edges of the multilayers reveal double‐layered structures of TiOx on CuPc, indicating the existence of two kinds of interface. Transverse photoconduction measurements on samples deposited on SnO2‐coated glass, using a back electrode of Al, show the occurrence of electron transfer from CuPc to TiOx at the interfaces.