Determination of the ionization energy of nitrogen acceptors in zinc oxide using photoluminescence spectroscopy
- 19 April 2004
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 84 (16) , 3049-3051
- https://doi.org/10.1063/1.1711162
Abstract
Photoluminescence spectroscopy of nitrogen-related emissions in ZnO is used to establish the ionization energy of the substitutional nitrogen acceptor. The temperature dependence of the nitrogen-related electron-acceptor (e,A 0 ) emission band has been monitored in as-grown single crystals of ZnO. Line shape analysis of this band is used to determine the acceptor ionization energy. The temperature dependence of the band gap for ZnO was included in our analysis and the low-temperature acceptor ionization energy for substitutional nitrogen at an oxygen site in ZnO was found to be E A =209±3 meV . Our line shape analysis indicates a small temperature-dependent decrease in E A for T>5 K .Keywords
This publication has 14 references indexed in Scilit:
- Optical investigations on excitons bound to impurities and dislocations in ZnOOptical Materials, 2003
- Donor–acceptor pair luminescence in nitrogen-doped ZnO films grown on lattice-matched ScAlMgO4 (0001) substratesSolid State Communications, 2003
- Molecular nitrogen (N2−) acceptors and isolated nitrogen (N−) acceptors in ZnO crystalsJournal of Applied Physics, 2003
- Optical Properties of the Nitrogen Acceptor in Epitaxial ZnOPhysica Status Solidi (b), 2002
- Characterization of homoepitaxial p-type ZnO grown by molecular beam epitaxyApplied Physics Letters, 2002
- Production of nitrogen acceptors in ZnO by thermal annealingApplied Physics Letters, 2002
- Donor–acceptor pair transitions in ZnO substrate materialPhysica B: Condensed Matter, 2001
- p-Type Electrical Conduction in ZnO Thin Films by Ga and N CodopingJapanese Journal of Applied Physics, 1999
- Neutral-donor–bound-exciton complexes in ZnO crystalsPhysical Review B, 1998
- Growth of p-type Zinc Oxide Films by Chemical Vapor DepositionJapanese Journal of Applied Physics, 1997