Automated phase-measuring profilometry: a phase mapping approach

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Abstract
When a sinusoidal grating is projected on either a reference plane or a diffuse object to be measured, every point along a line normal to the grating lines, on the reference plane as well as the object, can be characterized by a unique phase value. By measuring this phase accurately using phase modulation methods and by determining points on the reference plane and the object having identical phases, it is shown that the object height can be computed. A working system requires a projector, a translatable sinusoidal grating, and a detector array interfaced to a microcomputer. Results of measurements on diffuse test objects are described and errors are analyzed.