Interface Fluctuations in Disordered Systems:Expansion and Failure of Dimensional Reduction
- 5 May 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 56 (18) , 1964-1967
- https://doi.org/10.1103/physrevlett.56.1964
Abstract
A functional renormalization-group expansion is used to calculate the exponent which measures the roughness of an interface in a disorded Ising system as a function of length scale. Formal dimensional reduction is explicitly shown to break down at leading order in and field-theoretic methods fail. For random-field disorder is obtained which resolves the discrepancy between various previous calculations; for random-bond disorder, to leading order.
Keywords
This publication has 23 references indexed in Scilit:
- Huse, Henley, and Fisher respondPhysical Review Letters, 1985
- Pinning and Roughening of Domain Walls in Ising Systems Due to Random ImpuritiesPhysical Review Letters, 1985
- Equilibration of random-field Ising systemsPhysical Review B, 1984
- Nonequilibrium "Critical" Exponents in the Random-Field Ising ModelPhysical Review Letters, 1984
- Walks, walls, wetting, and meltingJournal of Statistical Physics, 1984
- Surface tension, roughening, and lower critical dimension in the random-field Ising modelPhysical Review B, 1983
- Roughening and Lower Critical Dimension in the Random-Field Ising ModelPhysical Review Letters, 1982
- The Ising model in a random field; supersymmetric surface fluctuations and their implications in three dimensionsJournal of Physics A: General Physics, 1981
- Lower Critical Dimension and the Roughening Transition of the Random-Field Ising ModelPhysical Review Letters, 1981
- Ferromagnetic Phase Transitions in Random Fields: The Breakdown of Scaling LawsPhysical Review Letters, 1976