Effect of interface roughness and scattering on the performance of AlAs/InGaAs resonant tunneling diodes
- 1 July 1993
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 11 (4) , 1743-1747
- https://doi.org/10.1116/1.586473
Abstract
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