Analytical approach to sizing nFET chains

2 July 1992

journal article
Published by Institution of Engineering and Technology (IET) in Electronics Letters

Vol. 28 (14) , 1334-1335
https://doi.org/10.1049/el:19920847

Abstract

An analytical approach to sizing nFET chains is presented. The technique is based on empirical observations of time constants in the classical RC delay model, and on a technology parameter determined from SPICE simulations. The technique allows a delay/area curve to be easily obtained, allowing tradeoff decisions by the circuit designer.

Keywords

SPICE SIMULATIONS
DELAY/AREA CURVE
TIME CONSTANTS
RC DELAY MODEL
NFET CHAINS
TECHNOLOGY PARAMETER

This publication has 0 references indexed in Scilit: