Theoretical Basis for Measuring the Saturation Emission of Highly Emitting Cathodes under Space-Charge-Limited Conditions
- 1 November 1955
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 26 (11) , 1353-1356
- https://doi.org/10.1063/1.1721907
Abstract
The second derivative of the current‐voltage relationship of an ideal plane diode is calculated from the Epstein‐Fry‐Langmuir analysis. From this analysis it is shown that for the large saturation emission characteristic of oxide‐coated cathodes at normal operating temperatures, the current at the inflection point (i.e., the zero of the second derivative) is a sensitive measure of the saturation emission and is unaffected by the existence of a linear interface impedance. It is also shown that the general features of the results apply to cylindrical diodes.This publication has 2 references indexed in Scilit:
- An Inflection-Point Emission TestProceedings of the IRE, 1955
- Standards on Electron Tubes: Definitions of Terms, 1950Proceedings of the IRE, 1950