Profile and in-plane structures of self-assembled monolayers on germanium/silicon multilayer substrates by high-resolution x-ray diffraction employing x-ray interferometry/holography
- 1 March 1993
- journal article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry
- Vol. 97 (9) , 1961-1969
- https://doi.org/10.1021/j100111a038
Abstract
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