Pulsed photothermal modeling of layered materials
- 15 January 1986
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 59 (2) , 348-357
- https://doi.org/10.1063/1.336690
Abstract
Exact analytical solutions of the heat-diffusion problem encountered in the pulsed photothermal evaluation of layered materials are presented. The analysis relates to the long-time decay of the front face temperature following the absorption of a surface heat pulse. The configuration of a coating on a substrate is analyzed, and the parameters governing the temperature evolution are identified with a particular emphasis on the thermal contact resistance term. This model provides a new method of measuring the quality of the interface. Previously published data and new experiments with laminated materials and living tissues are analyzed using the proposed analytical solutions.This publication has 12 references indexed in Scilit:
- Photoacoustic characterization of subsurface defects in plasma-sprayed coatingsThin Solid Films, 1984
- Techniques of flash radiometryJournal of Applied Physics, 1984
- Pulsed photothermal evaluation of layered materialsJournal of Applied Physics, 1984
- Thermal diffusivity in thin films measured by noncontact single-ended pulsed-laser-induced thermal radiometryOptics Letters, 1984
- Remote sensing applications of pulsed photothermal radiometryApplied Physics Letters, 1983
- Thin-film thickness measurements with thermal wavesApplied Physics Letters, 1983
- Thermal diffusivity of liquids determined by flash heating of a three-layered cellInternational Journal of Thermophysics, 1981
- Equation generalisee du touchau amelioration de la methode de mesure de l'effusivite thermiqueInternational Journal of Heat and Mass Transfer, 1980
- Mesure de l'effusivite par un appareil du type touchauInternational Journal of Heat and Mass Transfer, 1975
- Measurement of thermal conduction by the thermal comparatorJournal of Scientific Instruments, 1962