Direct measurement of crystallographic phase by electron diffraction
- 14 September 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 59 (11) , 1216-1219
- https://doi.org/10.1103/physrevlett.59.1216
Abstract
Three-beam diffraction is analyzed in a geometry appropriate for high-energy electron diffraction. An expression for the lowest-order correction to the kinematic intensity is derived from which a prescription for measuring crystallographic-phase invariant is obtained. This analysis is a good approximation for the diffraction observed in large convergence angle electron-diffraction patterns. Phase invariants are measured in the noncentrosymmetric crystal InP to an accuracy of ±15°. The technique provides a general and practical method for measuring phases.Keywords
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