The Use of Layered Synthetic Microstructures for Quantitative Analysis of Elements: Boron to Magnesium

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Abstract
Layered Synthetic Microstructures (LSMs) were first reported as commercially available diffracting structures for routine x-ray spectrochemical analysis in 1984 (Nicolosi et al.). Innitially, these devices (PX-1 and PX-2) were intended for use as alternatives for Thallium Acid Phthlate (TAP) and Lead Octadeconate (LOD) for improved stability and diffracted intensity. Improvements in the analytical performance of X-Ray Spectrometers for the elements carbon to magnesium has met, and in some cases exceeded, innitial expectations. Having captured the interest of many new possible applications, developments for LSMs with larger 2d-spacing and greater reflectivity have continued. Previous instruments employing LSMs have had difficulty in measuring X-Ray energies below the carbon K-series characteristic. Below the carbon K-edge energy, several significant phenomenon combine to reduce sensitivity. Among these are: 1) Reduced reflectivity of conventional LSMs, 2) Increased absorption at the polypropylene window of the detector, and 3) Greater electronic noise.