The Preparation of Difficult Samples for Transmission Electron Microscopy by lon Beam Thinning / Die Präparation schwieriger Proben für das Durchstrahlungselektronenmikroskop durch lonenstrahl-Dünnen
- 1 May 1979
- journal article
- research article
- Published by Walter de Gruyter GmbH in Practical Metallography
- Vol. 16 (5) , 222-236
- https://doi.org/10.1515/pm-1979-160503
Abstract
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