Subnanometer multilayers for x-ray mirrors: Amorphous crystals
- 1 June 1989
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 65 (11) , 4450-4451
- https://doi.org/10.1063/1.343288
Abstract
The use of ‘‘natural’’ crystals as Bragg diffractors has been supplemented by the advent of artificial composition-modulated structures, that is, multilayers. The extension of optical systems using soft x rays to hard x rays is now supplemented by the synthesis of subnanometer repeat period multilayers. These structures consist of layering amorphous planes, each an atomic spacing thick, and may therefore be thought of as ‘‘amorphous crystals.’’This publication has 9 references indexed in Scilit:
- Elastic modulus in composition-modulated copper-nickel foilsJournal of Applied Physics, 1983
- Critical-field measurements in Nb-Ti composition-modulated alloysJournal of Low Temperature Physics, 1982
- Thermoelectricity in composition-modulated Cu-Ni foilsApplied Physics Letters, 1982
- Layered synthetic microstructures as Bragg diffractors for X rays and extreme ultraviolet: theory and predicted performanceApplied Optics, 1981
- Controlled fabrication of multilayer soft-x-ray mirrorsApplied Physics Letters, 1980
- X-Ray Diffraction by Multilayered Thin-Film Structures and Their DiffusionJournal of Applied Physics, 1967
- Heterogeneities in Solid SolutionsPublished by Elsevier ,1959
- An Approximate Theory of Order in AlloysPhysical Review B, 1950
- An X-Ray Method of Determining Rates of Diffusion in the Solid StateJournal of Applied Physics, 1940