Study of epitaxial films of Ag, Pd and AgPd deposited by dc sputtering

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1 January 1990

journal article
Published by EDP Sciences in Microscopy Microanalysis Microstructures

Vol. 1 (3) , 189-197
https://doi.org/10.1051/mmm:0199000103018900

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
Surface and Interface Analysis, 1979
Quantitative approach of Auger electron spectrometry: I. A formalism for the calculation of surface concentrations
Surface Science, 1977