Detection of surface plasmons by scanning tunneling microscopy
Open Access
- 1 March 1991
- journal article
- research article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 9 (2) , 506-509
- https://doi.org/10.1116/1.585557
Abstract
The influence of surface plasmons excited in a polycrystalline silver film on the tunneling current of a scanning tunneling microscope (STM) has been analyzed. The plasmons cause an additional flow of electrons from the tungsten tip to the silver surface on the order of up to 50 pA. This process is independent of the polarity of the applied bias voltage, thereby excluding effects of thermal expansion. The different nature of the ordinary tunneling current and the surface plasmon induced current is clearly revealed by their different dependence on the gap distance. The local distribution of the intensity of the surface plasmon induced signal reveals structrues on a nanometer scale. Some of them are correlated to the surface topography.This publication has 0 references indexed in Scilit: