EELS of “thick” specimens
- 31 December 1991
- journal article
- other
- Published by Elsevier in Ultramicroscopy
- Vol. 38 (3-4) , 349-352
- https://doi.org/10.1016/0304-3991(91)90169-7
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Mass-thickness determination by Bethe-sum-rule normalization of the electron energy-loss spectrumUltramicroscopy, 1989
- Correcting electron energy loss spectra for artefacts introduced by a serial data collection systemJournal of Microscopy, 1984
- Design considerations and performance of an analytical stemUltramicroscopy, 1981
- Photon cross sections from 0.1 keV to 1 MeV for elements Z = 1 to Z = 94Atomic Data and Nuclear Data Tables, 1973