AN IMPROVED FULLY CMOS COMPATIBLE BIPOLAR STRUCTURE
- 1 September 1988
- journal article
- Published by EDP Sciences in Le Journal de Physique Colloques
- Vol. 49 (C4) , C4-93
- https://doi.org/10.1051/jphyscol:1988419
Abstract
A fully CMOS compatible bipolar technology is studied. 2-D process simulations of the device have been carried out before wafer processing ; comparisons of the results with experiments are presented. A new idea for making the collector, without standard epitaxy of a highly doped buried layer, is described. The 2-D simulation results enable the advantages to be checked with regard to the classical approachKeywords
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