X-ray fluorescence in the SEM - advantages in material analysis

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1 January 1986

journal article
research article
Published by Wiley in Scanning

Vol. 8 (5) , 232-238
https://doi.org/10.1002/sca.4950080506

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

Comparison of x‐ray elemental analysis by electron excitation and x‐ray fluorescence
Scanning, 1978