From trend charts to control charts: setup tests for making the leap

• 1 May 1993
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Semiconductor Manufacturing
• Vol. 6  (2) , 184-188
• https://doi.org/10.1109/66.216938

Abstract

Keywords

• TIME SERIES ANALYSIS
• CONTROL CHARTS
• TREND CHARTS
• STATISTICAL TESTS
• MONTE CARLO SIMULATIONS
• CAUSE FLAGS
• SPECIAL CAUSE
• INVESTMENT
• REJECTING GOOD