New results from MAXIMUM: an x-ray scanning photoemission microscope
- 13 January 1993
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 1741, 296-306
- https://doi.org/10.1117/12.138744
Abstract
The scanning soft x-ray photoemission microscope (MAXIMUM) operating at the Synchrotron Radiation Center at the University of Wisconsin-Madison has been substantially upgraded. The major upgrades are: installation of a new beam line that is optimized for the microscope; new optical mount and alignment system for the Schwarzschild objective; a new scanning stage; installation of a cylindrical mirror analyzer; implementation of an ultrahigh vacuum sample preparation chamber and transfer system; a new window-driven data acquisition program that is more flexible and user-friendly. The new system had demonstrated better than 0.1 micrometers spatial resolution, and photoemission data with 350 meV energy resolution has been obtained.Keywords
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