Dielectric breakdown of a random array of conducting cylinders

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Abstract
We develop a two-dimensional model for breakdown of metal-loaded dielectrics based on the breakdown of a random array of perfectly conducting cylinders embedded in a uniform dielectric and determine the breakdown field, breakdown-path geometry, and dielectric constant as a function of metal-packing fraction. The computer solution of Laplace’s equation in the random geometry uses the boundary-element method and the random-packing configurations are generated by the Monte Carlo method. We compare the simulation results with exact lower bounds for the dielectric constant and scaling arguments for the breakdown field.

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