Quantitative X‐ray fluorescence analysis of thin films using LAMA‐2
- 1 January 1981
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 10 (1) , 28-30
- https://doi.org/10.1002/xrs.1300100108
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Simultaneous determination of composition and mass thickness of thin films by quantitative x-ray fluorescence analysisAnalytical Chemistry, 1977
- Lama I — A General Fortran Program for Quantitative X-ray Fluorescence AnalysisPublished by Springer Nature ,1977
- Errors in theoretical correction systems in quantitative electron probe microanalysis. SynopsisAnalytical Chemistry, 1972
- Some applications of a computer program for quantitative spectrochemical analysisX-Ray Spectrometry, 1972
- Theoretical analysis of quantitative x-ray emission data. Glasses, rocks, and metalsAnalytical Chemistry, 1971
- Theoretical Formulas for Film Thickness Measurement by Means of Fluorescence X-RaysPublished by Springer Nature ,1969
- Calculation methods for fluorescent x-ray spectrometry. Empirical coefficients versus fundamental parametersAnalytical Chemistry, 1968