DERIVATION OF MICROSTRUCTURE PARAMETERS OF FINELY DISPERSED SYSTEMS FROM ATOM-PROBE DATA

Open Access

1 November 1987

journal article
Published by EDP Sciences in Le Journal de Physique Colloques

Vol. 48 (C6) , C6-571
https://doi.org/10.1051/jphyscol:1987693

Abstract

Various methods available for the exploitation of atom-probe concentration profiles are discussed. The determination of microstructure parameters of a nickel base superalloy containing small precipitates is given as an example

Keywords

FINELY DISPERSED
DISPERSED SYSTEMS
MICROSTRUCTURE PARAMETERS
ATOM PROBE DATA
SYSTEMS FROM ATOM
PARAMETERS OF FINELY

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