Directional acoustic microscopy for observation of elastic anisotropy
- 1 March 1983
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 42 (5) , 413-415
- https://doi.org/10.1063/1.93959
Abstract
A directional acoustic microscope is described that has enhanced contrast for elastically anisotropic materials. Directional detection of surface acoustic waves by the acoustic lens is demonstrated on (100) and (111) silicon crystals. The grains of a polycrystalline silicon sample have contrast which varies as a function of lens orientation. Symmetry of contrast variations and measurement of surface wave phase velocity may provide a new way to determine the orientation of microscopic grains.Keywords
This publication has 5 references indexed in Scilit:
- Leaky SAW velocity on water/silicon boundary measured by acoustic line-focus beamElectronics Letters, 1982
- A physical model for acoustic signaturesJournal of Applied Physics, 1979
- An angular-spectrum approach to contrast in reflection acoustic microscopyJournal of Applied Physics, 1978
- Acoustic microscopy at optical wavelengthsApplied Physics Letters, 1978
- Characteristic material signatures by acoustic microscopyElectronics Letters, 1978