Accelerated Testing in FAMOS Devices - 8K EPROM

• 1 April 1978
• proceedings article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium
• p. 229-232
• https://doi.org/10.1109/irps.1978.362851

Abstract

Keywords

• SYSTEM TESTING
• EPROM
• TEMPERATURE