Reexamination of the Si(100) surface reconstruction
- 1 December 1980
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 19 (23) , 3971-3973
- https://doi.org/10.1364/ao.19.003971
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 19 references indexed in Scilit:
- Diffraction of He at the reconstructed Si(100) surfacePhysical Review B, 1980
- Double diffraction spots in RHEED patterns from clean Ge(111) and Si(001) surfacesSurface Science, 1979
- On the structure of reconstructed Si(001)2×1 and Ge(001)2×1 surfacesJournal of Physics C: Solid State Physics, 1979
- The structure of Si(OOl) 2 × 1 surface — Studied by low energy electron diffractionSurface Science, 1978
- An electron diffraction study of the structure of silicon (100)Surface Science, 1978
- Theory of reconstruction induced subsurface strain — application to Si(100)Surface Science, 1978
- The surface structure of Si(100) surfaces using averaged LEED: II. The (2×1) clean surface structureSurface Science, 1977
- Structural studies of the adsorption of Cs and O2 on Si(100)Surface Science, 1974
- Low-Energy Electron Diffraction Study of Silicon Surface StructuresThe Journal of Chemical Physics, 1962
- Structure and Adsorption Characteristics of Clean Surfaces of Germanium and SiliconThe Journal of Chemical Physics, 1959