Time resolved microwave conductivity measurements for the characterization of transport properties in thin film micro-crystalline silicon
- 1 March 1997
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 296 (1-2) , 94-97
- https://doi.org/10.1016/s0040-6090(96)09377-7
Abstract
No abstract availableKeywords
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