Length dependence of localization and electron-electron interaction effects in thin metal films
- 15 May 1983
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 27 (10) , 6522-6525
- https://doi.org/10.1103/physrevb.27.6522
Abstract
The electrical properties of thin films of and of Pt with lengths as small as 0.25 μm have been studied. At temperatures below about 10 K, the resistance increases with decreasing temperature due to localization and electron-electron interaction effects, as found in previous studies of much longer films. For films with lengths shorter than about 5 μm, the resistance rise decreases as the length of the film is decreased. This behavior is in agreement with general expectations concerning finite-size effects in these systems. However, it does not appear that the theory, at least in its present form, can account quantitatively for our results.
Keywords
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