Built-in self-test (BIST) structure for analog circuit fault diagnosis
- 1 June 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 39 (3) , 517-521
- https://doi.org/10.1109/19.106284
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Built-in self-test (BIST) design of large-scale analog circuit networksPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- On the implementation of an analog ATPG: the nonlinear caseIEEE Transactions on Instrumentation and Measurement, 1988
- On the Implementation of an Analog ATPG: The Linear CaseIEEE Transactions on Instrumentation and Measurement, 1985
- Built-In Self-Test TechniquesIEEE Design & Test of Computers, 1985
- Fault diagnosis of analog circuitsProceedings of the IEEE, 1985
- Node-fault diagnosis and a design of testabilityIEEE Transactions on Circuits and Systems, 1983
- Analog multifrequency fault diagnosisIEEE Transactions on Circuits and Systems, 1983
- Multiple-fault location of analog circuitsIEEE Transactions on Circuits and Systems, 1981