Dielectric-relaxation currents in cadmium borosilicate glasses

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Abstract
A dielectric‐relaxation model has been proposed by Simmons and Taylor to explain anomalous currents in silicon nitride thin films. In this study, similar currents are observed in certain cadmium borosilicate glasses. The presence of a color center and of composition indepedence of the activation energy for electronic conduction (1.42±0.02 eV) indicate that these glasses possess identifiable defect energy states which are required by the dielectric‐relaxation model. The glass compositions range from 57.5 to 67.5 mol% cadmium oxide with the B2O3/SiO2 mole ratio held constant at 2.25. The results are experimental verification of the dielectric‐relaxation phenomena in a bulk noncrystalline solid.