High-temperature X-ray diffraction: solutions to uncertainties in temperature and sample position

• 1 February 1993
• journal article
• research article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 26  (1) , 77-81
• https://doi.org/10.1107/s002188989200877x

Abstract

Keywords

• TEMPERATURE X RAY
• SAMPLE POSITION
• HIGH TEMPERATURE
• UNCERTAINTIES IN TEMPERATURE
• TEMPERATURE AND SAMPLE
• SOLUTIONS TO UNCERTAINTIES