Reliability of GaAs PHEMT under hydrogen containing atmosphere
- 24 August 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 247-250
- https://doi.org/10.1109/gaas.1994.636977
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Hydrogen effects on reliability of GaAs MMICsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Reliability of state-of-the-art GaAs pseudomorphic low-noise HEMTsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Physics with catalytic metal gate chemical sensorsCritical Reviews in Solid State and Materials Sciences, 1989