Thickness dependence of the stem ratio image
- 31 December 1982
- journal article
- other
- Published by Elsevier in Ultramicroscopy
- Vol. 10 (3) , 297-299
- https://doi.org/10.1016/0304-3991(82)90051-1
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Study of supported ruthenium catalysts by STEMJournal of Microscopy, 1981
- A study of grain boundary segregation in Cu-Bi alloys using STEMPhilosophical Magazine A, 1979
- Z contrast of platinum and palladium catalystsPhilosophical Magazine A, 1978
- Measurement of inelastic/elastic scattering ratio for fast electrons and its use in the study of radiation damagePhysica Status Solidi (a), 1976
- Scanning transmission electron microscopy of thin specimensUltramicroscopy, 1976