Use of a semiconductor detector in anomalous (resonance) X-ray scattering measurement of local structure of an amorphous alloy
- 15 May 1984
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 222 (1) , 259-261
- https://doi.org/10.1016/0167-5087(84)90540-4
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Local structure of amorphous MO50Ni50 determined by anomalous x-ray scattering using synchroton radiationSolid State Communications, 1983
- Application of Differential Anomalous X-Ray Scattering to Structural Studies of Amorphous MaterialsPhysical Review Letters, 1981
- Partial structure factors in a liquid or amorphous binary system using anomalous scatteringJournal of Physics C: Solid State Physics, 1971