An X-Ray Spectrometer for Polymer Studies

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Abstract
A Geiger counter x-ray spectrometer has been designed and constructed suitable for the quantitative study of crystallinity and orientation in polymers and of relaxation phenomena associated with these properties. The instrument is designed for use with crystal monochromatized or filtered radiation, and has such features as Soller slit collimation, means of studying the materials above room temperature, and a Geiger counter monitor on the x-ray beam. The spectrometer, pertinent techniques, and typical results are described.