Energy dissipation processes in scanning tunneling microscopy
- 15 August 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 34 (4) , 2899-2902
- https://doi.org/10.1103/physrevb.34.2899
Abstract
Energy dissipation associated with assisted tunneling processes in scanning tunneling microscopy is analyzed and compared with the normal tunnel current. We find that, for high voltages, greater than one volt, the tunneling processes associated with electron-hole pair excitation control the increase in temperature at the microscope's interface.Keywords
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