Interactions between thick resistive films and design criteria for segmented resistors
- 14 May 1987
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 20 (5) , 664-666
- https://doi.org/10.1088/0022-3727/20/5/017
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The Microstructure of RuO2Thick Film Resistors and the Influence of Glass Particle Size on their Electrical PropertiesIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1984
- Investigation of parameter sensitivity of short channel mosfetsSolid-State Electronics, 1982