Characterization of thin-film electroluminescent structures by SIMS and other analytical techniques
- 1 January 1985
- journal article
- research article
- Published by Springer Nature in Analytical and Bioanalytical Chemistry
- Vol. 322 (2) , 175-180
- https://doi.org/10.1007/bf00517656
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Zinc chalcogenide thin films grown by the atomic layer epitaxy technique using zinc acetate as source materialThin Solid Films, 1985
- Characterization of materials by secondary ion mass spectrometry (SIMS): New possibilities of trace, micro and surface analysisAnalytical and Bioanalytical Chemistry, 1983
- Fluorometric Determination of Aluminum in the Partper-Billion RangeAnalytical Chemistry, 1961