Application of the FabryÁ-Perot Interferometer as a Refractometer

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Abstract
A new method is used to determine the interference orders for various wavelengths in thick dispersive layers. The method is based on an order transformation in which the interference order is expressed in terms of a lower order representing the number of subtractive moiré fringes which are producible along the interferometer axis with each spectrum doublet. Knowing the unambiguous value of the moiré order, it is possible to deduce exactly either the absolute value of the interference order making use of a doublet with close components, or the difference of interference order in the case of a doublet with widely spaced components. The optical length can be determined accurately to the sixth decimal place of a millimeter. The refractive index of a layer of one centimetre thickness is determined accurately to the seventh decimal place. A new transformation of the Sellmeir dispersion formula facilitates the determination of the parameters of the atomic oscillators for glass.

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