A structure with an irregular layer lattice in poly(γ‐methyl L‐glutamate‐co‐γ‐benzyl L‐glutamate) film

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Abstract
Two types of films showing different characteristic x‐ray equatorial patterns were prepared from chloroform and N,N‐dimethylformamide solutions of poly(γ‐methyl L‐glutamate‐co‐γ‐benzyl L‐glutamate). In the film cast from chloroform solution, the x‐ray pattern on the equator consisted of a remarkable mixture of sharp and diffuse reflections, with the sharp reflections corresponding to integral values of 1/3k. On the other hand, in the film cast from N,N‐dimethylformamide solution, a well‐defined x‐ray pattern was observed. An explanation for this characteristic pattern of chloroform‐cast film was made on the basis of a structural model wherein stacking faults or dislocations are incorporated into the ordered structure characteristic of N,N‐dimethylformamide‐cast film. Two domains divided by a stacking fault are mutually displaced along the (100) crystal planes, but the shape and size of the unit cell is everywhere the same. The intensity distribution of x‐ray diffraction was calculated as a function of the probability of a stacking fault occurring in a regular sequence of (100) planes. The best correspondence with observation was obtained with a stacking fault in every three layers, on the average.

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