Discovery of a new type of layered structure by high resolution electron microscopy and electron-induced X-ray microanalysis
- 1 January 1983
- journal article
- research article
- Published by Royal Society of Chemistry (RSC) in Journal of the Chemical Society, Chemical Communications
- No. 10,p. 594-595
- https://doi.org/10.1039/c39830000594
Abstract
Combined high resolution electron microscopy, energy dispersive X-ray emission microanalysis, and computer simulation studies indicate that a layered intermediate phase exists in the Bi–Mo–W–O system, its idealized composition being Bi2(W,Mo)12O35; the structure consists of Bi2O3 sheets interleaved with (W,Mo)2O5 sheets which contain crystallographic shear planes that are perpendicular to the layers.Keywords
This publication has 0 references indexed in Scilit: