Empirical Correction Factors for the Electron Microanalysis of Silicates and Oxides
- 1 July 1968
- journal article
- Published by University of Chicago Press in The Journal of Geology
- Vol. 76 (4) , 382-403
- https://doi.org/10.1086/627339
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- X-Ray-Emission Microanalysis of Rock-Forming Minerals. V. OrthopyroxenesThe Journal of Geology, 1966
- X-Ray-Emission Microanalysis of Rock-Forming Minerals: VI. Clinopyroxenes near the Diopside-Hedenbergite JoinThe Journal of Geology, 1966
- X-Ray-Emission Microanalysis of Rock-Forming Minerals III. Alkali FeldsparsThe Journal of Geology, 1966
- X-Ray-Emission Microanalysis of Rock-Forming Minerals IV. Plagioclase FeldsparsThe Journal of Geology, 1966
- X-Ray-Emission Microanalysis of Rock-Forming Minerals II. OlivinesThe Journal of Geology, 1966
- X-Ray-Emission Microanalysis of Rock-Forming Minerals I. Experimental TechniquesThe Journal of Geology, 1965
- P-207: An interlaboratory standard muscovite for argon and potassium analysesJournal of Geophysical Research, 1965
- Reaction between mafic magmas and pelitic schist, Cortlandt, New YorkAmerican Journal of Science, 1964
- An Empirical Method for Electron Microanalysis.Analytical Chemistry, 1964
- Hornblendes Formed During Progressive Metamorphism Of Amphibolites, Northwest Adirondack Mountains, New YorkGSA Bulletin, 1962