Anisotropic relaxation during the first stages of the growth of ZnTe/(001) CdTe strained layers studied by reflection high energy electron diffraction
- 19 June 1995
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 66 (25) , 3456-3458
- https://doi.org/10.1063/1.113386
Abstract
The first stages of the growth of highly strained ZnTe on (001)CdTe are studied by reflection high energy electron diffraction (RHEED) with real-time monitoring of the surface in-plane lattice spacing and of the width of the streaks along the [100], [110], and [11̄0] azimuths. A large, oscillating, elastic relaxation is measured below the critical thickness (≊5 ZnTe monolayers) in the [11̄0] azimuth while a small excess of tensile stress with regard to the CdTe substrate is observed in the [110] azimuth. These effects are attributed to an anisotropic nontetragonal elastic distortion at the free edges of elongated 2D ZnTe-monolayer islands. For large deposition times (i.e., after the critical thickness), the RHEED observation gives very good information about the nature of the dislocations occurring in the multiplication process.Keywords
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