Diffusion induced grain boundary migration (DIGM) and liquid film migration (LFM) in an Al-2.07 wt% Cu alloy
- 30 November 1991
- journal article
- Published by Elsevier in Acta Metallurgica et Materialia
- Vol. 39 (11) , 2835-2845
- https://doi.org/10.1016/0956-7151(91)90101-6
Abstract
No abstract availableKeywords
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