Measurement of Operational Amplifier Characteristics in the Frequency Domain
- 1 March 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. IM-34 (1) , 59-64
- https://doi.org/10.1109/tim.1985.4315257
Abstract
A test circuit for the automatic measurement of integrated-circuit operational amplifiers in the frequency domain has been developed. The main advantage of this test circuit over those previously reported in the literature is that it uses buffers in the feedback loop to reduce the influence of the output impedance of the operational amplifier. A fit program has been developed to extract the relevant parameters such as the transfer characteristics, the common mode rejection ratio, and the power supply rejection ratio. Examples of measurements are added for several operational amplifiers.Keywords
This publication has 2 references indexed in Scilit:
- Analysis of the settling behavior of an operational amplifierIEEE Journal of Solid-State Circuits, 1982
- The monolithic op amp: a tutorial studyIEEE Journal of Solid-State Circuits, 1974