Noise associated with recombination in the emitter space charge region of transistors

This publication has 3 references indexed in Scilit:

• Base resistance measurements on bipolar junction transistors via low temperature bridge techniques
  Solid-State Electronics, 1976
• Current-voltage relations and equivalent circuits of transistors at high injection levels
  Solid-State Electronics, 1974
• Noise due to generation and recombination of carriers in p-n junction transition regions
  IEEE Transactions on Electron Devices, 1968