A unified statistical approach to recombination-generation noise in semiconductors
- 1 December 1961
- journal article
- Published by Elsevier in Journal of Physics and Chemistry of Solids
- Vol. 22, 379-383
- https://doi.org/10.1016/0022-3697(61)90285-2
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Irreversible Thermodynamics and Carrier Density Fluctuations in SemiconductorsPhysical Review B, 1958