Focussing method of crystal powder analysis by X-rays

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Abstract
The conditions of reflection of X-rays from a thin layer of crystal powder are discussed and it is pointed out that for any given angle of reflection a surface of double curvature can be found, such that it will reflect X-rays coming from one point, to any other definite point. For an element of this surface, situated so as to be distant from the two points by lengths a and b respectively, the relation sin α/sin β = a/b must be satisfied where α and β are the glancing angles of incidence and of emergence of the X-rays with respect to the surface. An arrangement for crystal analysis based on this relation is discussed and expressions are given for its resolving power. An apparatus of this type for photographic work and a hot cathode X-ray bulb of simple design are described. A new determination of the lattice constant of nickel oxide is given.

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